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Single-event upset in the PowerPC750 microprocessorIn this paper we report results of single-event tests of the PowerPC750 from Motorola and IBM, which are identical designs which are manufactured with advanced processes that uses a minimum feature size of 0.29 and 0.28 mu m, respectively.
Document ID
20210002208
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Millward, D. G.
Irom, F.
Farmanesh, F.
Guertin, S. M.
Swift, G. M.
Date Acquired
June 18, 2001
Publication Date
June 18, 2001
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
single
event
upset
SEU
microprocessor
space
radiation

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