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Ion induced stuck bits in 1T/1C SDRAM cellsRadiation exposure of certain types of devices tends to stick bits, causing them to not be read out correctly after programming.
Document ID
20210002217
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/12968
Authors
Swift, G. M.
Nguyen, D.
Scheick, L. Z.
Guertin, S. M.
Edmonds, L. D.
Date Acquired
July 16, 2001
Publication Date
July 16, 2001
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
stuck
bits

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