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On-Wafer Testing of Circuits Through 220 GHzWe have jointly developed the capability to perform on-wafer s-parameter and noise figure measurements through 220 GHz.
Document ID
20210002936
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/17611
Authors
Boll, G.
Oleson, C.
Samoska, L.
Gaier, T.
Date Acquired
April 15, 1999
Publication Date
April 15, 1999
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
MMIC
amplifiers
test
&
measurements

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