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Device SEE Susceptibility Update: 1996-1998This paper summarizes single event upset and latchup data from 1996 to 1998 from numerous sources.
Document ID
20210002945
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/17631
Authors
Swift, G.
Miyahira, T.
Coss, J.
Date Acquired
July 12, 1999
Publication Date
July 12, 1999
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
single
event
effects
single
event
gate
rupture

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