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Infrared Emission Spectroscopy as a Reliability ToolUNKNOWN
Document ID
20210003287
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/17189
Authors
Kayali, S.
Kim, Q.
Date Acquired
November 14, 1999
Publication Date
November 14, 1999
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
infrared
emission
excitation
spectroscopy
GaAs
Non-destructive
lifetime
reliability
channel
temperature

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