Transient Structure Current Generated by the Activation of a Squib Device

Experimental measurements of the currents in pyro-activation circuits show that a structure current is generated during the pyro-activation process. This current is a transient current and is an intense source of electromagnetic interference. Analysis has indicated that the noise voltage induced on candidate victim circuits is sufficient to cause circuit upset and/or latchup. A survey of flight anomaly records has also correlated the occurrence of anomalies with the pyro-activation process. Detailed analyses, taking the spacecraft cabling configuration and circuit sensitivities into account, have shown that the structure current induced noise voltage could definitely be the cause of the anomalies. The threat of the structure current due to pyro-activation can be alleviated by isolating the pyro-activation circuit from ground and by proper arrangement of the cables in sensitive circuits.