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Delta-Doped CCDs for Enhanced UV PerformanceThin, backside-illuminated CCds are modified by growing a delta-doped silicon layer on the back surface using molecular beam epitaxy. Delta-doped CCDs exhibit stable and uniform 100 percent internal quantum efficiency. The process consists of growth of an epitaxial silicon layer on a fully-processed commercial CCd die in which 30 percent of a monolayer of boron atoms are incorporated into the lattice nominally in a single atomic layer. Long term stability was tested and showed no degradation of the device quantum efficiency over sixteen months.
Document ID
20210004375
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Grunthaner, F.
Terhune, R.
Grunthaner, P.
Hoenk, M.
Nikzad, S.
Date Acquired
July 26, 1994
Publication Date
July 26, 1994
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
silicon
quantum
efficiency
backside-illumination
photoelectrons

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