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Metrology system for Space Interferometry Mission system testbed 3In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.
Document ID
20210005041
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/8021
Authors
Gursel, Y.
Goullioud, R.
Alvarez-Salazar, O.
Azizi, A.
Date Acquired
May 16, 2004
Publication Date
May 16, 2004
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
interferometry
metrology
optics

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