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Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level TestingThe paper describes a simple method developed to use and combine subsystem or assembly level accelerated test results withthe system level test results to estimate achieved overall system reliability.
Document ID
20210005067
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/24655
Authors
Krasich, Millena
Date Acquired
May 13, 1996
Publication Date
May 13, 1996
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
achieved
reliability
goal
reliability
assembly
level
test
time
system
level
test
time
test
acceleration
subsystem
reliability
system
reliability

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