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Single-event transients in high-speed comparatorsSingle-event transients are produced in linearintegrated circuits when they are exposed to heavy ions or protons, and those transients can be a significant problem for electronic circuits in spacecraft.
Document ID
20210005364
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/37157
Authors
Johnston, A. H.
Miyahira, T. F.
Irom, F.
Date Acquired
July 16, 2002
Publication Date
July 16, 2002
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
space
radiation
micorelectronics
single-event
upset

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