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Metrology for the Micro-Arcsecond Metrology TestbedThe Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths.
Document ID
20210005390
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/19349
Authors
Lin, Y.
Azevedo, S.
Gursel, Y.
Shaklan, S.
Kuhnert, A.
Date Acquired
March 19, 1998
Publication Date
March 19, 1998
Publication Information
Publisher: UNKNOWN
Distribution Limits
Public
Copyright
Other
Technical Review
Keywords
interferometer
interferometry
metrology
picometer
heterodyne
interferometer

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