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Single-Event Effect Test Report International Rectifier 80SCLQ060SCS Schottky DiodeThis study was undertaken to determine the destructive single event effect and degradation susceptibility of the 80SCL060SCS Schottky diode. The device was monitored for destructive events and degradation in the reverse bias current during exposure to a heavy ion beam at Texas A&M University's K500 Cyclotron.
Document ID
20210009916
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Ted Wilcox (Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Matt Joplin (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
February 8, 2021
Publication Date
December 8, 2020
Publication Information
URL: https://radhome.gsfc.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA/TM-20210009916
Funding Number(s)
PROJECT: Roman Space Telescope and PACE
WBS: 134180.02.02.02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert

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