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Single-Event Transient Case Study for System-Level Radiation Effects AnalysisAnalog single-event transient results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.
Document ID
20210010826
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Michael J Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Rebekah Ann Austin (Goddard Space Flight Center Greenbelt, Maryland, United States)
Edward P Wilcox (Goddard Space Flight Center Greenbelt, Maryland, United States)
Hak S Kim (Science Systems and Applications (United States) Lanham, Maryland, United States)
Raymond L Ladbury (Goddard Space Flight Center Greenbelt, Maryland, United States)
Kenneth A LaBel (National Aeronautics and Space Administration Washington D.C., District of Columbia, United States)
Jonathan A Pellish (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
March 2, 2021
Publication Date
April 1, 2021
Publication Information
Publication: IEEE Transactions on Nuclear Science
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Issue Publication Date: February 12, 2021
URL: https://ieeexplore.ieee.org/document/9353557
DOI: 10.1109/TNS.2021.3059174
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: virtual
Country: US
Start Date: November 29, 2020
End Date: December 30, 2020
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 724297.40.49.04.01
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
External Peer Committee
Keywords
Single-event effects
single-event transients
radiation
system-level effects

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