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Highly Absorptive Pupil Mask Fabricated with Black SiliconMany of NASA’s direct imaging of exoplanet missions and projects require fabricated coronagraph masks to control scattering and diffraction of light. The designed, patterned mask intended for the coronagraphic testbeds are highly absorptive in the visible range on non-metallic regions. In this work, we employed the cryogenic etching process to fabricate black silicon (BSi) to achieve a high aspect ratio (HAR) structures with higher etch rate than conventional reactive ion etching (REI). Recent bidirectional reflectance distribution function (BRDF) measurements of uniformly etched BSi on silicon wafer show highly diffusive BSi with a specular reflective component in the orders of seven magnitudes lower than the total hemispherical reflectance when the polarized or non-polarized incident beam is used.
Document ID
20210013534
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Ron Shiri
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Christine Jhabvala
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Georgi Georgiev
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Alyssa Barlis
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Remi Soummer
(Space Telescope Science Institute Baltimore, Maryland, United States)
Peter Petrone
(Sigma Space (United States) Lanham, Maryland, United States)
Marc Kuchner
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Edward Wollack
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael Biskach
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Timo Saha
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Will Zhang
(Goddard Space Flight Center Greenbelt, Maryland, United States)
James J Butler
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
April 12, 2021
Publication Date
September 9, 2019
Publication Information
Publication: Proceedings of SPIE
Publisher: SPIE
Volume: 11116
Issue Publication Date: September 9, 2019
ISSN: 0277-786X
e-ISSN: 1996-756X
URL: https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11116/111161H/Highly-absorptive-pupil-mask-fabricated-with-black-silicon/10.1117/12.2532567.full?SSO=1&tab=ArticleLink
Subject Category
Earth Resources And Remote Sensing
Meeting Information
Meeting: SPIE Optics + Photonics 2019
Location: San Diego, CA
Country: US
Start Date: August 11, 2019
End Date: August 15, 2019
Sponsors: International Society for Optics and Photonics
Funding Number(s)
WBS: 509496.02.03.01.17.18
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
External Peer Committee
Keywords
BRDF
REI
fabricated black silicon
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