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SRAM-based FPGA: high dose test methods using evaluation boardsWe present low-cost and effective methods and results for high levels of Total Ionizing Dose testing performed on the Xilinx Kintex UltraScale (20nm) Field-Programmable Gate Array evaluation board using 60Co and 2 MeV electron sources.
Document ID
20210013816
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Thorbourn, Dennis
Allen, Gregory R.
Vartanian, Sergeh
Date Acquired
September 16, 2019
Publication Date
September 16, 2019
Publication Information
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2019
Distribution Limits
Public
Copyright
Other
Technical Review

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