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Dealing with Ion LET Uncertainties: An Application of Generalized Linear ModelsWe propose Generalized Linear Models for understanding errors in SEE rate due to uncertainties in LET of the ion responsible for the event. Applications are suggested and assessed for suitability of treatment by the model.
Document ID
20210016861
Acquisition Source
Goddard Space Flight Center
Document Type
Poster
Authors
Ray Ladbury
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
June 2, 2021
Publication Date
June 11, 2021
Publication Information
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: virtual
Country: US
Start Date: July 16, 2021
End Date: July 23, 2021
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 817091.40.31.51.04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
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