NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Computing Risk of Pyrotechnic Devices Using Lot Acceptance Testing This paper presents an application of statistical engineering to solve the problem of determining the effects of reducing test sample sizes and environment levels in lot acceptance testing (LAT) of ordnance devices used by NASA and DoD space systems. Unlike environmental testing of dedicated qualification hardware, ordnance devices have a test-like-you-fly exception and use lot acceptance sampling or LAT. LAT is performed by randomly selecting a predefined number of devices from an individual lot and exposing them to a more severe dynamic shock and vibration testing environments than flight (sometimes as high as 6 decibels over flight environments) and then performing a destructive test on the device. Recent trends have been suggested to reduce LAT costs by reducing environment test levels or the number of devices per LAT, or both. A method is given here to compute flight risk, so the proposed methods can be compared by subject matter experts to the baseline LAT methods. In addition, this method can be used to determine the best methods to include in future LAT standards for pyrotechnic devices.
Document ID
20210017277
Acquisition Source
Langley Research Center
Document Type
Accepted Manuscript (Version with final changes)
Authors
James M. Womack
(The Aerospace Corporation El Segundo, California, United States)
Date Acquired
June 9, 2021
Publication Date
June 30, 2021
Publication Information
Publication: Military Operations Research (MOR) Journal
Publisher: Military Operations Research Society
Volume: 26
Issue: 3
Issue Publication Date: July 1, 2021
ISSN: 1082-5983
e-ISSN: 2163-2758
URL: https://www.jstor.org/stable/27070891
Subject Category
Mathematical And Computer Sciences (General)
Funding Number(s)
WBS: 869021.01.23.01.01
CONTRACT_GRANT: 80LARC19F0121
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Computing Risk
Pyrotechnic Devices
Lot Acceptance Testing
ordnance
pyrotechnics
risk
flight environments
No Preview Available