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Martian Dust Abrasion Damage on Solar Arrays: HALT Experimental Investigation and Opportunity Rover Performance AnalysisWe explored the utility of ground-based highly accelerated life testing (HALT) on epitaxial lift-off (ELO) triple-junction coverglass interconnected cells (CICs) after exposure to simulated Martian dust storms. Dust storm impingement was replicated by sandblasting CICs with Mars dust simulant replicating conditions similar to the weather conditions reported by the Viking landers. We observed that even in cases when there are no observable open circuit voltage (VOC) losses, the minority carrier lifetime is reduced. Short circuit current (JSC) losses can be recovered upon cleaning, suggesting JSC losses are not linked to permanent damage, like cell cracking. This suggests a permanent degradation could be determined by quantifying the difference between recoverable and non-recoverable power loss. We mined field data from the Mars Exploration Rover, Opportunity and extracted a degradation rate to compare to our experimental data. We found exceptional agreement between 4.9 Martian years of mined field data (9.4%) and the irreversible damage observed in our HALT experiment (9.7%). We demonstrate that the laboratory method for exposing CICs to Martian dust storm conditions well represents the physical reality of long duration CIC operation on Mars.
Document ID
20210017426
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Lyndsey McMillon-Brown
(Glenn Research Center Cleveland, Ohio, United States)
Timothy J Peshek
(Glenn Research Center Cleveland, Ohio, United States)
AnnaMaria Pal
(Glenn Research Center Cleveland, Ohio, United States)
Jeremiah McNatt
(Glenn Research Center Cleveland, Ohio, United States)
Date Acquired
June 11, 2021
Subject Category
Lunar And Planetary Science And Exploration
Meeting Information
Meeting: Photovoltaics Specialists Conference
Location: Virtual
Country: US
Start Date: June 20, 2021
End Date: June 25, 2021
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 255421.04.22.20.01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
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