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Dealing with Ion LET Uncertainties: An Application of Generalized Linear ModelsAlthough most SEE rate estimation methods presume a fit to SEE cross section vs. LET, fitting SEE data is challenging because the data are not compatible with the assumptions of many common fitting techniques (e.g. linear regression. The difficulty of fitting such data is compounded when the LET of the ion responsible for an SEE is uncertain. We modify a Generalized Linear Model SEE data fitting methodology to accommodate uncertain LET and apply the method to the problem of backside heavy-ion SEE testing to demonstrate the utility of the method, explore the dependence of systematic errors that arise from improper treatment of LET uncertainty and develop guidelines for minimizing such systematic errors when proper treatment is not possible. Additional applications are suggested and assessed for suitability of treatment by the model.
Document ID
20210018021
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Raymond L Ladbury
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
June 28, 2021
Publication Date
December 30, 2021
Publication Information
Publication: IEEE Transactions on Nuclear Science (TNS)
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
URL: http://www.nsrec.com/
Subject Category
Electronics And Electrical Engineering
Quality Assurance And Reliability
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Virtual
Country: US
Start Date: July 19, 2021
End Date: July 23, 2021
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
WBS: 817091.40.31.51.04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Single-event effects
reliability estimation
quality assurance
statistical techniques
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