Investigation of Rectifier Diode Failures in the NEXT-C Power Processing Unit

NASA's Evolutionary Xenon Thruster-Commercial (NEXT-C) project is tasked with developing flight electric propulsion systems, including both thrusters and power processing units (PPUs). In 2018, the beam supply in a NEXT-C engineering prototype PPU experienced an output rectifier diode failure during development thermal-vacuum testing. A failure investigation led by NASA GRC identified the root cause of the failure as a thermal runaway caused by increased reverse recovery losses in the diodes when the PPU was run at its maximum operating temperature. Significant reverse recovery performance variations were identified in diodes with the same part number but manufactured by different vendors. The failure investigation was able to collect evidence of the increased reverse recovery and replicate the diode failures in a controlled laboratory environment.