Microwave Photoelasticity: Exploiting Multiple Resonances to Measure Stress Changes within Yttria-Partially-Stabilized-Zirconia

The NASA Glenn Research Center is developing non-destructive-testing (NDT) methods to enable the measurement of stresses embedded in optically opaque materials using microwave radiation in a free-space quasi-optical system. This methodology tracks microwave resonances observed in reflected scattering parameters extracted from materials under load. In this paper, we report the successful measurement of the stress-optic-coefficient of bulk yttria-partially stabilized zirconia (YTZP) ceramic of C = 1.42 x 10-4 ± 6.65 x 10-6 (1/GPa), across W-Band (80-100 GHz), and determined that this result is independent of sample thickness. The primary goal of this research is to establish a methodology to quantify and assess the life expectancy of ceramic thermal and environmental barrier coating (TBCs/EBCs). Bulk YTZP samples can undergo multiple resonances within a contiguous measurement bandwidth, each corresponding to an integer multiple wave number ∝. This allows for the acquisition and analysis of multiple stress measurement points within a single sample. As an additional benefit, one can approximate the refractive index of YTZP across a wide bandwidth by observing multiple resonances produced by a set of samples with varying thicknesses. Using this approach, the refractive index of bulk YTZP was found to be n = 5.80 ± 0.043 across the 85-115 GHz frequency band.