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Angle Dependence of Focused X-Ray-Induced Single Event Transients
Document ID
20210020642
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Kaitlyn L Ryder
(Vanderbilt University Nashville, Tennessee, United States)
Landen D Ryder
(Vanderbilt University Nashville, Tennessee, United States)
Andrew L. Sternberg
(Vanderbilt University Nashville, Tennessee, United States)
John A. Kozub
(Vanderbilt University Nashville, Tennessee, United States)
En Xia Zhang
(Vanderbilt University Nashville, Tennessee, United States)
Stephen D. LaLumondiere
(The Aerospace Corporation El Segundo, California, United States)
Daniele M. Monahan
(The Aerospace Corporation El Segundo, California, United States)
Jeremy P. Bonsall
(The Aerospace Corporation El Segundo, California, United States)
Robert A Weller
(Vanderbilt University Nashville, Tennessee, United States)
Ronald D. Schrimpf
(Vanderbilt University Nashville, Tennessee, United States)
Robert A. Reed
(Vanderbilt University Nashville, Tennessee, United States)
Date Acquired
August 17, 2021
Publication Date
September 1, 2021
Publication Information
Publication: Presentation for posting on public website
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 30th Single Event Effects (SEE) Symposium / Military and Aerospace Programmable Logic Devices (SEE-MAPLD) Workshop
Location: Virtual
Country: US
Start Date: August 31, 2021
End Date: September 2, 2021
Sponsors: SEE Symposium, California
Funding Number(s)
CONTRACT_GRANT: 80NSSC20K0424
CONTRACT_GRANT: HDTRA1-16-1-0007
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
Heavy ions
Focused x-ray
single-event effects
single-event transients
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