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Radiation-Induced Defects in BJTs on NASA ELDRS Space ExperimentPost-exposure flight data on BJTs are analyzed with a Silvaco model to extract interface traps.
Document ID
20210021538
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Adalin R Benedetto (Arizona State University Tempe, Arizona, United States)
C Cook (Arizona State University Tempe, Arizona, United States)
M J Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
S Roark (Arizona State University Tempe, Arizona, United States)
A Tender (Yale University New Haven, Connecticut, United States)
H J Barnaby (Arizona State University Tempe, Arizona, United States)
Date Acquired
September 13, 2021
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 38th Hardened Electronics and Radiation Technology (HEART) Conference
Location: Tarrytown, NY
Country: US
Start Date: March 7, 2022
End Date: March 11, 2022
Sponsors: Non Profit Committee
Funding Number(s)
PROJECT: LWSSET-0000-0018 (Living With A Star SET)
WBS: 499999.01.01.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
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