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Single-Event Effect Test Report Analog Devices LTC1604AIG#90117 ADCThis study is to characterize the destructive single-event latchup (SEL) susceptibility of the LTC1604AIG#90117 (LTC1604) analog/digital converter (ADC). The device was monitored for SEL current events on the power supplies during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. Testing was performed on September 11, 2021.
Document ID
20210024585
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
Anthony M Phan (Science Systems and Applications (United States) Lanham, Maryland, United States)
Matthew B Joplin (Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael J Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
November 18, 2021
Publication Date
November 30, 2021
Publication Information
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
NASA/TM-20210024585
Funding Number(s)
WBS: 429953.05.04.02.DJ45.21
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
single-event latchup (SEL)
analog/digital converter (ADC)
Lawrence Berkeley National Laboratory (LBNL)

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