Acquisition Source
Goddard Space Flight Center
Document Type
Accepted Manuscript (Version with final changes)
Authors
Aubin Antonsanti (University of Toulouse Toulouse, Midi-Pyrénées, France) Cedric Virmontois (Centre National D'Etudes Spatiales Paris, France) Jean-Marie Lauenstein (Goddard Space Flight Center Greenbelt, Maryland, United States) Alexandre Le Roch (Universities Space Research Association Columbia, Maryland, United States) Hugo Dewitte (University of Toulouse Toulouse, Midi-Pyrénées, France) Vincent Goiffon (University of Toulouse Toulouse, Midi-Pyrénées, France) Date Acquired
December 20, 2021
Publication Date
March 17, 2022
Publication Information
Publication: IEEE Transactions on Nuclear Science
Publisher: Institute of Electrical and Electronics Engineers
Volume: 1
Issue Publication Date: March 17, 2022
ISSN: 0018-9499
e-ISSN: 1558-1578
URL: https://ieeexplore.ieee.org/
Subject Category
Solid-State PhysicsSpace Radiation Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee
Keywords
CMOS Image Sensor (CIS)Displacement Damage Dose (DDD)Dark Current Random-Telegraph-Signal (DC-RTS)Pinned Photodiode (PPD)