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Texas Instruments LM7171 Voltage Feedback Amplifier Laser Single-Event Effects Characterization Test ReportThe purpose of this testing was to characterize the pulsed-laser-induced single event effect (SEE) susceptibility of the Texas Instruments LM7171 voltage feedback amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.
Document ID
20210026449
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
Kaitlyn L. Ryder (Goddard Space Flight Center Greenbelt, Maryland, United States)
Anthony M. Phan (Arctic Slope Regional (United States) Barrow, Alaska, United States)
Michael J. Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Ani Khachatrian (United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Dale P. McMorrow (United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Adrian Ildefonso (United States Naval Research Laboratory Washington D.C., District of Columbia, United States)
Date Acquired
January 6, 2022
Publication Date
July 27, 2018
Publication Information
Subject Category
Electronics And Electrical Engineering
Lasers And Masers
Funding Number(s)
WBS: 000278.05.07.04.01
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
pulsed-laser testing
Single-Event Effects (SEE)
feedback amplifier

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