Analysis of Solar Wind Damage in Genesis Sapphire Sample 61527

The Genesis mission collected samples of the solar wind (SW) by passive implantation into a variety of semiconductor (and other) materials and re-turned them to Earth in 2004. Subsets of these col-lector materials were exposed to either bulk solar wind, high-speed (coronal hole) solar wind, low speed (inter-stream) solar wind, or coronal mass ejections (CMEs). Although of short duration relative to naturally space-weathered materials, these exposures to SW caused structural damage (and related chemical changes) in silicon. Here we explore the structural consequences of bulk SW collection into Genesis single crystal sapphire.