NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Compendium of Current Heavy Ion Single-Event Effects Test Results for Candidate Electronics for NASA Johnson Space CenterWe present radiation effects test results and analysis produced by NASA JSC in 2021 for candidate electronic components and devices. Devices tested include integrated circuits, MOSFETs, DC-DC converters, and various commercial solutions.
Document ID
20220000601
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Joshua M Pritts (Jacobs (United States) Dallas, Texas, United States)
Razvan Gaza (Johnson Space Center Houston, Texas, United States)
Charles R Bailey (Johnson Space Center Houston, Texas, United States)
Kyson V Nguyen (Jacobs (United States) Dallas, Texas, United States)
Date Acquired
January 26, 2022
Subject Category
Space Radiation
Meeting Information
Meeting: IEEE Nuclear & Space Radiation Effects Conference
Location: Provo, UT
Country: US
Start Date: July 18, 2022
End Date: July 22, 2022
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNJ13HA01C
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Avionics
EEEE Parts
Radiation testing
Heavy ions
Ionizing radiation effects on electronics

Related Records

There are no records associated with this record.
No Preview Available