Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Eliad Peretz (Goddard Space Flight Center Greenbelt, Maryland, United States) Peter Wizinowich (W.M. Keck Observatory Waimea, Hawaii, United States) Bert Pasquale (Goddard Space Flight Center Greenbelt, Maryland, United States) Guillaume Filion (OMP inc.) Maxwell A Miller-Blanchaer (University of California, Santa Barbara Santa Barbara, California, United States) John Mather (Goddard Space Flight Center Greenbelt, Maryland, United States) Shui Hung Kwok (W.M. Keck Observatory Waimea, Hawaii, United States) Scott Lilley (W.M. Keck Observatory Waimea, Hawaii, United States) Jean Thomas Landry (OMP inc.) Luke Gers (W.M. Keck Observatory Waimea, Hawaii, United States) Eduardo Marin (W.M. Keck Observatory Waimea, Hawaii, United States) Sam Ragland (W.M. Keck Observatory Waimea, Hawaii, United States) Ed Wetherell (W.M. Keck Observatory Waimea, Hawaii, United States) Jason Chin (W.M. Keck Observatory Waimea, Hawaii, United States) Rebecca Jensen-Clem (University of California, Santa Barbara Santa Barbara, California, United States) Peter Kurczynski (Goddard Space Flight Center Greenbelt, Maryland, United States) Shobita Satyapal (George Mason University Fairfax, Virginia, United States) Peter Plavchan (George Mason University Fairfax, Virginia, United States) Etienne Gauvin (OMP inc.) Imke de Pater (University of California, Berkeley Berkeley, California, United States) Steph Sallum (University of California, Irvine Irvine, California, United States) Eric Nielsen (New Mexico State University Las Cruces, New Mexico, United States) Date Acquired
August 5, 2022
Publication Date
July 18, 2022
Subject Category
Instrumentation And Photography Meeting Information
Meeting: SPIE Astronomical Telescopes + Instrumentation 2022
Location: Montreal, Quebec
Country: CA
Start Date: July 17, 2022
End Date: July 22, 2022
Sponsors: International Society for Optics and Photonics
Funding Number(s)
WBS: 432938.09.01.04.40.10
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
External Peer Committee