Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
A W Yu (Goddard Space Flight Center Greenbelt, Maryland, United States) K Numata
(Goddard Space Flight Center Greenbelt, Maryland, United States) C Brambora (Goddard Space Flight Center Greenbelt, Maryland, United States) J Camp (Goddard Space Flight Center Greenbelt, Maryland, United States) M Fahey (Goddard Space Flight Center Greenbelt, Maryland, United States) A Feizi (AK Aerospace Technology Corporation Greenbelt, Maryland, United States) K Heesh (Relative Dynamics Greenbelt, Maryland, United States) H Jiao (Goddard Space Flight Center Greenbelt, Maryland, United States) O Konoplev (Science Systems and Applications (United States) Lanham, Maryland, United States) M Mullin (Goddard Space Flight Center Greenbelt, Maryland, United States) S Merritt (TRAX International Las Vegas, Nevada, United States) W Mamakos (Science Systems and Applications (United States) Lanham, Maryland, United States) S Marlow (ATA Aerospace Greenbelt, Maryland, United States) D Poulios (Goddard Space Flight Center Greenbelt, Maryland, United States) P Pruessner (Goddard Space Flight Center Greenbelt, Maryland, United States) M Rodriguez (Goddard Space Flight Center Greenbelt, Maryland, United States) A Vasilyev (Science Systems and Applications (United States) Lanham, Maryland, United States) S Wu (Goddard Space Flight Center Greenbelt, Maryland, United States) X Xu (Science Systems and Applications (United States) Lanham, Maryland, United States) A Yevick (Goddard Space Flight Center Greenbelt, Maryland, United States) U Singh (Langley Research Center Hampton, Virginia, United States) Date Acquired
August 12, 2022
Publication Date
December 11, 2022
Meeting Information
Meeting: Advanced Solid State Lasers Conference (ASSL)
Location: Barcelona, Catalunya
Country: ES
Start Date: December 11, 2022
End Date: December 15, 2022
Sponsors: Optical Society
Funding Number(s)
WBS: 244904.04.09.05.05.02.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert