Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
C D K Herd (University of Alberta Edmonton, Alberta, Canada) T Bosak 
(Massachusetts Institute of Technology Cambridge, Massachusetts, United States) K A Farley (California Institute of Technology Pasadena, California, United States) K M Stack (Jet Propulsion Lab La Cañada Flintridge, California, United States) K C Benison (West Virginia University Morgantown, West Virginia, United States) B A Cohen (Goddard Space Flight Center Greenbelt, Maryland, United States) A D Czaja (University of Cincinnati Cincinnati, Ohio, United States) V Debaille (Université Libre de Bruxelles Brussels, Belgium) Y Goreva (Jet Propulsion Lab La Cañada Flintridge, California, United States) E M Hausrath (University of Nevada, Las Vegas Las Vegas, Nevada, United States) K Hickman-Lewis (Museum of London London, United Kingdom) E N Mansbach (Massachusetts Institute of Technology Cambridge, Massachusetts, United States) L E Mayhew (University of Colorado Boulder Boulder, Colorado, United States) M A Sephton (Imperial College London London, Westminster, United Kingdom) N Randazzo (University of Alberta Edmonton, Alberta, Canada) D L Shuster (University of California, Berkeley Berkeley, California, United States) S Siljestrom (RISE Research Institutes of Sweden Gothenburg, Sweden) J I Simon (Johnson Space Center Houston, Texas, United States) M Wadhwa (Arizona State University Tempe, Arizona, United States) B P Weiss (Massachusetts Institute of Technology Cambridge, Massachusetts, United States) M -P Zorzano (Centro de Astrobiologia Aberdeen, United Kingdom) A J Brown (Plancius Research Severna Park, Maryland, United States) Date Acquired
January 10, 2023
Subject Category
Lunar and Planetary Science and Exploration Meeting Information
Meeting: 54th Lunar and Planetary Science Conference
Location: Woodlands, TX
Country: US
Start Date: March 13, 2023
End Date: March 17, 2023
Sponsors: Universities Space Research Association
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
