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Single-Event Effect Testing of the Microchip MRH25N12U3 (JANSR2N7593) n-Type Power MOSFETThis study was undertaken to determine the single-event effect susceptibility of the radiation-hardened MRH25N12U3 (JANSR2N7593) power MOSFET recently developed by Microchip Technology, Inc.
Document ID
20230001108
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Jean-Marie Lauenstein (Goddard Space Flight Center Greenbelt, Maryland, United States)
Jason M. Osheroff (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
January 23, 2023
Publication Date
March 22, 2022
Publication Information
Publication: NASA Technical Memorandum (TM) test report for posting on public website https://nepp.nasa.gov/
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Social and Information Sciences (General)
Funding Number(s)
WBS: 817091.40.31.51.04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert

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