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MAX1340 12-Bit, Multichannel ADCs/DACs Single-Event Effects Characterization Test Report Using Heavy IonsThis study is to characterize the destructive single event latchup (SEL) susceptibility of the MAX1340 analog/digital converter (ADC) or digital/analog converter (DAC). The device was monitored for SEL current events on the power supplies during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron.
Document ID
20230001253
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
Thomas A. Carstens (Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael J. Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Anthony M. Phan (System Science Applications (United States) Los Angeles, California, United States)
Hak S. Kim (Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
January 25, 2023
Publication Date
February 1, 2023
Publication Information
Subject Category
Electronics and Electrical Engineering
Space Radiation
Funding Number(s)
WBS: 000278.05.13.04.04
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
ADC
DAC
single event effects

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