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Ceramic Capacitor Grain Size Analysis Using Electron Backscatter Diffraction (EBSD)The overall scope of this NESC study was to identify (or develop) a tool, methodology, or process that can inspect a ceramic capacitor and consistently return repeatable grain size distribution results. It is important to note that the development of a machine learning technique was considered as an option for this study, but only if an existing automated tool was not available. This report explains why the Electron Backscatter Diffraction analysis method for grain structure and size distribution was deemed a suitable candidate for this work.
Document ID
20230004147
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Robert F Hodson
(Langley Research Center Hampton, Virginia, United States)
Susana P Douglas
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Christopher M Green
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Wesley A Tayon
(Langley Research Center Hampton, Virginia, United States)
James M Baughman
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Jay A Brusse
(Science Systems and Applications (United States) Lanham, Maryland, United States)
Henning W Leidecker
(Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
March 29, 2023
Publication Date
March 1, 2023
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
NESC-RP-19-01418
NASA/TM-20230004147
Funding Number(s)
WBS: 869021.01.23.01.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
Electron Backscatter Diffraction
Automated Tool
Machine Leaning
Multilayer Ceramic Capacitors
NASA Engineering and Safety Center
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