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Space Induced Discharge Model to Be Used on Interface Circuit Vulnerability AssessmentNo abstract provided
Document ID
20230004973
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/56304
Authors
Xie, Julie
Kim, Wousik
Chinn, James Z.
Wong, Kit Pui Frankie
Date Acquired
January 3, 2022
Publication Date
January 3, 2022
Publication Information
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2022
Distribution Limits
Public
Copyright
Other
Technical Review

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