NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
New High-Throughput Dual-Electron Beam Spacecraft Charging Test Capability at JPLNo abstract provided
Document ID
20230005500
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/56380
Authors
Chai, Jarrett
Kim, Wousik
McKee, Michael
Eyre, Anthony
Zhu, Brian Xiaoyu
Chen, Qian Nataly
Thorbourn, Dennis
Green, Nelson
Andersen, Allen J
Date Acquired
December 7, 2021
Publication Date
December 7, 2021
Publication Information
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2021
Distribution Limits
Public
Copyright
Other
Technical Review

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available