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C30665L CD3740 Displacement Damage and Total Ionizing Dose Test ReportThe purpose of this testing is to provide preliminary characterization of the displacement damage and total ionizing dose effects via 63 MeV protons on InGaAs PIN photodiodes fabricated and assembled by Excelitas for use in a LIDAR system. The testing is being conducted to determine the susceptibility of the component to the radiation environment that it will be exposed to during mission duration.
Document ID
20230008953
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
External Source(s)
https://radhome.gsfc.nasa.gov/
Authors
Landen D Ryder (Goddard Space Flight Center Greenbelt, Maryland, United States)
Jean-Marie Lauenstein (Goddard Space Flight Center Greenbelt, Maryland, United States)
Marc J Matyseck (Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
June 13, 2023
Publication Date
July 1, 2023
Publication Information
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
NASA/TM-20230008953
Funding Number(s)
WBS: 000278.05.07.04.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert

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