Recent Development Work with Self-Aligned Focusing Schlieren

A novel compact focusing schlieren instrument has recently been developed that eliminates the need for a separate source and cutoff grid. The technique works by projecting an image of a grid onto a retroreflective surface and then reimaging the projection back onto the original grid. By manipulating the polarization state of the light passing through the instrument, a single Rochon polarizing prism can be used to adjust the schlieren sensitivity by translating it along the instrument’s optical axis, which changes the in-plane offset between the reimaged projection and the original grid. This arrangement makes the instrument inherently self-aligned. Relative to conventional focusing schlieren instruments, which require alignment of a separate source grid and cutoff grid to achieve sensitivity, the setup time required in order to obtain high quality focusing schlieren images is significantly reduced. Further, the self-aligned nature of this instrument makes it insensitive to vibrations and allows for on-the-fly adjustments to field-of-view. In this paper we discuss recent work that has been performed to expand the capabilities of this self-aligned focusing schlieren instrument including: schlieren visualization at extreme angles for optically-restricted test facilities, 3D schlieren visualization using a light field camera, acquisition of high quality focusing schlieren images from facilities with low quality windows, and obtaining focusing schlieren images in full-scale ground test facilities.