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Single-Event Effects Test Report Texas Instruments, OPA842 Low-Noise Operational AmplifierTesting was done to characterize the Texas Instruments Operational Amplifiers OPA842 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
Document ID
20230009770
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Kaitlyn L Ryder (Goddard Space Flight Center Greenbelt, United States)
Jonathan D Barth (Goddard Space Flight Center Greenbelt, United States)
Michael J Campola (Goddard Space Flight Center Greenbelt, United States)
Matthew B Joplin (Goddard Space Flight Center Greenbelt, United States)
Thomas A Carstens (Goddard Space Flight Center Greenbelt, United States)
Richard J Hare (Langley Research Center Hampton, United States)
Date Acquired
June 30, 2023
Publication Date
November 1, 2022
Publication Information
URL: https://radhome.gsfc.nasa.gov/
Subject Category
Instrumentation and Photography
Electronics and Electrical Engineering
Report/Patent Number
NASA/TM-20230009770
Funding Number(s)
WBS: 394490.02.01.01.01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert

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