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Recent Developments to the Porous Microstructure Analysis (PuMA) SoftwareIntroduction
The Porous Microstructure Analysis (PuMA) software is an open source framework for image-based simulation, primarily used to determine effective properties based on material microstructure. PuMA was originally developed for the study of NASA thermal protection materials; however, many of the solvers in PuMA have applicability to a broad range of materials science applications. PuMA version 3.2 computes material surface area, pore diameters, effective thermal conductivity, continuum and rarefied tortuosity, and permeability. For anisotropic materials, PuMA can estimate material orientation and compute anisotropic thermal conductivity and elasticity. In this talk, a brief overview of the PuMA software and underlying methods will be presented, as well as some recent and ongoing developments, including the use of immersed boundary methods for image-based simulation and the development of a new weave segmentation tool, called TomoSAM.

Cut-Cell method for heat and mass transfer
For simulations on complex microstructures, traditional unstructured meshing techniques often prove to be difficult and time-intensive. Voxel-based solvers, which represent the surface as a staircase structure, are relatively simple to implement but can lose accuracy when feature resolution is poor. In this work, we present a novel 3D cut-cell method for solving the variable coefficient Poisson equation on complex microstructures, suitable for the determination of effective thermal conductivity or tortuosity of a material. The method uses a Marching Cubes/Marching Squares surface reconstruction to create cut-cells and determine geometric quantities. A flux-correction method is extended to 3D, with least squares gradient reconstruction, to solve for the boundary fluxes in the cut-cells. Verification cases show the solver achieves globally 2nd order accuracy on complex microstructures.

TomoSAM
TomoSAM, a module of the PuMA software, has been developed as a plugin for 3D Slicer, a software platform used for 3D image processing and visualization. It utilizes the Segment Anything Model (SAM), a deep learning model capable of identifying objects and generating image masks based on minimal user input. This feature enables efficient segmentation of complex 3D datasets, particularly of woven materials, from tomography or similar imaging methods, reducing the need for manual segmentation.
Document ID
20240001230
Acquisition Source
Ames Research Center
Document Type
Presentation
Authors
Joseph C. Ferguson
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Federico Semeraro
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Arnaud Borner
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Francesco Panerai
(University of Illinois at Urbana Champaign Urbana, Illinois, United States)
John M. Thornton
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Sergio Fraile Izquierdo
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Alexandre Quintart
(Science and Technology Corporation (United States) Hampton, Virginia, United States)
Nagi N. Mansour
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Date Acquired
January 26, 2024
Subject Category
Engineering (General)
Computer Programming and Software
Meeting Information
Meeting: 6th International Conference on Tomography of Materials and Structures (ICTMS)
Location: Cape Town
Country: ZA
Start Date: July 1, 2024
End Date: July 5, 2024
Sponsors: inTACT (United States)
Funding Number(s)
CONTRACT_GRANT: NA15BB15C
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Keywords
Tomography
Microscale modeling
3D Segmentation
Conductivity
Orientation
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