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Single-Event Effects Test Report Micron MTFDHBK256TDP-1AT12AIYY NVMe Solid-State Drive
Document ID
20240001937
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Edward P. Wilcox
(Goddard Space Flight Center Greenbelt, United States)
Date Acquired
February 12, 2024
Publication Date
January 27, 2024
Publication Information
Publication: NASA Technical Memorandum (TM) Test Report
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Computer Programming and Software
Electronics and Electrical Engineering
Funding Number(s)
WBS: 817091.40.31.51.04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
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