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NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage
Document ID
20240006599
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Eric Galloway (Science Systems and Applications (United States) Lanham, Maryland, United States)
Date Acquired
May 21, 2024
Publication Date
June 3, 2024
Publication Information
Subject Category
Electronics and Electrical Engineering
Meeting Information
Meeting: 2024 NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: US
Start Date: June 3, 2024
End Date: June 6, 2024
Sponsors: National Aeronautics and Space Administration, NASA Electronic Parts and Packaging (NEPP) Program
Funding Number(s)
WBS: 817091.40.31.51.02
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
EEE
failure analysis
integrated circuit (IC)
isolation
electrical damage

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