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Collaborative Evaluation of GaN FET Reliability
Document ID
20240006694
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Christopher Tiu
(Goddard Space Flight Center Greenbelt, United States)
Toren Hobbs
(Marshall Space Flight Center Redstone Arsenal, United States)
Carol Putman
(Marshall Space Flight Center Redstone Arsenal, United States)
Kristen Boomer
(Glenn Research Center Cleveland, United States)
Ahmad Hammoud
(HX5, LLC)
Date Acquired
May 23, 2024
Subject Category
Electronics and Electrical Engineering
Meeting Information
Meeting: 15th Annual NASA Electronic Parts and Packaging Program's Electronics Technology Workshop (NEPP ETW)
Location: Greenbelt, MA
Country: US
Start Date: June 3, 2024
End Date: June 6, 2024
Sponsors: National Aeronautics and Space Administration
Funding Number(s)
WBS: 817091.40.31.62.02
CONTRACT_GRANT: 80GRC020D0003
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
GaN
FET GaN
High Power GaN
Reliability of power device
Thermal Shock
Low Temperature Thermal Cycling
Failure Analysis
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