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X-Ray Diffraction Measurements of Residual Stress in a Cold Sprayed Ni CoatingX-ray diffraction (XRD) was used to investigate the residual stress in a cold sprayed Ni coating which failed to form a bimetallic joint with NASA HR-1. The objective was to apply pure Ni by cold spray as a diffusion barrier between the Ni-based alloy NASA HR-1 and the Cu-based GRCop-42 for a thrust cell assembly. After additive manufacturing of the GRCop-42 cylinder, the commercially pure Ni coating was cold sprayed onto the cylinder. It was intended to have NASA HR-1 applied directly onto the Ni coating by Directed Energy Deposition (DED), however the bond failed during the first layer of DED. Residual stress measurements were collected via the Sin²ψ method in three equally spaced locations on the top surface of the Ni coating in both as-cold sprayed and heat-treated conditions. The results revealed both compressive and tension stresses on the as-cold sprayed sample and compressive stresses in the heat-treated sample. The results were illuminated when plotted at their respective positions and with their respective orientation angles around a circle. This showed rotational symmetry in the residual stress measurements, which correlated to the processing method used during application of the Ni coating.
Document ID
20240009415
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Laura Wilson
(Glenn Research Center Cleveland, United States)
Elizabeth Young-Dohe
(Glenn Research Center Cleveland, United States)
David Ellis
(Glenn Research Center Cleveland, United States)
Richard Rogers
(Glenn Research Center Cleveland, United States)
Date Acquired
July 23, 2024
Subject Category
Metals and Metallic Materials
Meeting Information
Meeting: Denver X-Ray Conference
Location: Westminster, CO
Country: US
Start Date: August 5, 2024
End Date: August 9, 2024
Sponsors: International Centre for Diffraction Data
Funding Number(s)
WBS: 264925.04.28.22
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
NASA Peer Committee
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