Demonstration of Portable X-ray Fluorescence Spectroscopy for High-Throughput In-Situ Quantification of Surface Lunar Dust for Testing and Future Surface Missions

In this paper, we present a new method of quantification for surface concentrations of lunar dust and lunar simulant for use and deployment for development testing and potential eventual use for verification and development testing and lunar surface missions. This technique demonstrates the use of portable X-ray fluorescence spectroscopy (pXRF) to quantify lunar dust loading on surfaces using an adaption of existing pXRF techniques. This paper shows the background in current methodologies for quantification of lunar dust in tests as well as current and potential future techniques for lunar surface missions, as well as current applications of commercial off-the-shelf (COTS) pXRF technology. The methodology for adapting current pXRF techniques is presented, followed by a demonstration of this new method on a variety of materials related to spaceflight or lunar surface missions. This technique shows high fidelity for immediate utilization as well as a demonstration of high potential for future surface missions.