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Computational Investigation of Oxidative Etch Pitting in FiberForm and Its Impact on Material PropertiesOxidation-driven carbon erosion does not occur uniformly but rather through the development of localized etch pits at active surface sites. These active sites form due to atomic defects on the carbon surface, making them significantly more reactive than the surrounding, non-defective areas. As a result, these sites are the first to react during ablation, leading to their removal. This process creates new defects in neighboring atoms, increasing their reactivity and causing localized carbon removal around these active sites. In this way, the highly reactive defective areas serve as nucleation points for the formation and growth of etch pits, which can have adverse effects on structural integrity of FiberForm.

To better understand how these etch pits impact the material properties of carbon fiber microstructures, we have developed a new capability within the direct simulation Monte Carlo (DSMC) framework to capture the etch pit formation process. This capability, integrated into the DSMC code SPARTA (Stochastic Parallel Rarefied-gas Time-accurate Analyzer), models material removal in the presence of active sites, leading to the formation of etch pits. The current work focuses on studying the effects of these etch pits on the material properties of FiberForm, a widely used base material in thermal protection systems (TPS). The microstructure of virgin FiberForm, obtained via X-ray microtomography, is imported into SPARTA to generate the ablated geometries with etch pits. These modified microstructures are then analyzed using the Porous Microstructure Analysis (PuMA) software to compute various material properties, including elasticity, thermal conductivity, and permeability.

We investigate the variation of these properties due to the complex surface topology changes caused by etch pit formation. Additionally, we compare the effects of pitting with the conventional model of shrinking fibers, traditionally used to simulate the ablation of carbon structures. Significant differences emerge between the two approaches. Consequently, this physically realistic model of material removal through etch pit formation offers improved accuracy in predicting the degradation of carbon-based TPS during oxidation. It also provides insights into other mechanisms, such as spallation, where chunks of material are removed into the flow due to etch pit growth. Ultimately, this model enhances our understanding of failure modes in these materials during ablation.
Document ID
20240013530
Acquisition Source
Ames Research Center
Document Type
Poster
Authors
Krishnan Swaminathan Gopalan
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Arnaud Borner
(Analytical Mechanics Associates (United States) Hampton, Virginia, United States)
Date Acquired
October 24, 2024
Subject Category
Chemistry and Materials (General)
Meeting Information
Meeting: 14th Ablation Workshop 2024
Location: Laurel, MD
Country: US
Start Date: November 5, 2024
End Date: November 7, 2024
Sponsors: Johns Hopkins University Applied Physics Laboratory, Ames Research Center
Funding Number(s)
CONTRACT_GRANT: NNA15BB15C
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
NASA Peer Committee
Keywords
PuMA
SPARTA
DSMC
Microstructure
Etch Pitting
Oxidation
Carbon Ablators
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