Additively Manufactured Plastic Plasma Spectrometer

We report results in development and testing of a low resource top hat electrostatic analyzer (ESA) for space plasma measurements. This device has been additively manufactured (3D-printed) using fused deposition modeling. The classic top hat design is composed of four plastic pieces, without any surface coatings. The three conducting electrodes are printed from carbon nanotube infused polyether ether ketone (CNT-PEEK). The fourth piece, an insulating electrode support, uses pure PEEK. This ESA is designed to detect electrons in space from 10eV up to 30 keV. We demonstrate that the printed CNT-PEEK is sufficiently electrically conductive to support the fast high voltage slewing often required for high time resolution measurements. The plastic ESA has been successfully vibrated beyond standard pre-flight levels, tested under keV electron beam illumination over a wide range of temperatures, and tested under UV illumination, simulating the solar Ly-α flux. In comparison with an identical machined aluminum ESA, our CNT-PEEK ESA provides nominal energy/angle band passes, closely matching simulation. These band passes imply minimal impact from surface charging at beam energies of 2-3 keV, although more investigation is needed. We also find that the CNT-PEEK ESA provides far superior out-of-band electron rejection and UV photon rejection compared to the machined aluminum ESA. We do not detect any problems with trapped gases or outgassing. This development offers potential for significant mass savings, implementation of otherwise unattainable geometric configurations, and dramatic simplification in manufacturing and assembly processes required for development of space plasma instruments.