Invited: Error Estimation for Unsteady Pressure Sensitive Paint MeasurementsThe Unsteady Pressure Sensitive Paint (uPSP) team at NASA Ames uses the lifetime method to measure steady pressures and the intensity method to obtain the unsteady (fluctuating component) of pressure. As with any measurement, it is also important to understand the associated levels of uncertainty. This paper presents a method to propagate the main error sources through the working equations for steady and unsteady pressure measurements, for both the lifetime method and intensity method, and generate uncertainty estimates. Having such estimates is important for test planning purposes and for data quality checks. Two forms of errors are considered. Random error originates mostly from shot noise and read noise inherent in the camera system and manifests as a root-mean-square error in steady pressure measurements or a noise floor in power spectral densities generated from unsteady pressure measurements. Bias error originates mostly from uncertainties in surface temperature and paint calibration and is observed as an offset relative to static pressure tap and pressure transducer measurements. These error sources are discussed, including the behavior of the cameras and the paint, and a tool for estimating error is developed. This estimation method is then compared to measurements from pressure transducers obtained in the Launch Vehicle Demo Test (LVDT), a large scale uPSP wind tunnel test performed in the Ames 11-Foot Transonic Wind Tunnel.
Document ID
20240015319
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
David D. Murakami (Ames Research Center Mountain View, United States)
Lawrence A. Hand (Ames Research Center Mountain View, United States)
Kenneth R. Lyons (Ames Research Center Mountain View, United States)
Marc A. Shaw-Lecerf (Ames Research Center Mountain View, United States)
Elizabeth Lara Lash (Ames Research Center Mountain View, United States)
Nettie H. Roozeboom (Ames Research Center Mountain View, United States)
Nicholas Califano (Metis Technology Solutions Orlando, Florida, United States)
Jie Li (Metis Technology Solutions Mountain View, United States)
Date Acquired
November 29, 2024
Subject Category
Instrumentation and Photography
Meeting Information
Meeting: AIAA SciTech Forum
Location: Orlando, FL
Country: US
Start Date: January 6, 2025
End Date: January 10, 2025
Sponsors: American Institute of Aeronautics and Astronautics