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A Screening Method Using Pulsed Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
Document ID
20240015425
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Jay Brusse (Science Systems and Applications (United States) Lanham, Maryland, United States)
Lyudmyla Ochs (Goddard Space Flight Center Greenbelt, United States)
Date Acquired
December 3, 2024
Publication Date
December 31, 2024
Publication Information
Publisher: NASA Electronic Parts and Packaging (NEPP) Program
URL: https://nepp.nasa.gov/
Subject Category
Electronics and Electrical Engineering
Quality Assurance and Reliability
Instrumentation and Photography
Meeting Information
Meeting: Electrical, Electronic, and Electromechanical (EEE) Parts Engineer 101 Workshop
Location: Virtual
Country: US
Start Date: December 3, 2024
End Date: December 4, 2024
Sponsors: National Aeronautics and Space Administration, Jet Propulsion Laboratory
Funding Number(s)
WBS: 817091.40.31.51.02
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert

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