Coordinated Analyses of Microcraters in Bennu Samples

The OSIRIS-REx mission seeks to understand how space weathering processes such as ion irradiation and micrometeorite impacts have modified the mineralogy and chemistry of Bennu’s surface [1, 2]. To collect particles from the topmost surface of Bennu that could show evidence for space weathering, contact pads made of stainless-steel Velcro were placed around the perimeter of the Touch-And-Go Sample Acquisition Mechanism (TAGSAM). These contact pads successfully collected particles from the surface of Bennu and evidence for space weathering was identified, including the presence of micrometeoroid impact craters and melt splashes on grain surfaces [1]. Here we report the coordinated focused-ion beam scanning-electron microscopy (FIB-SEM) and transmission electron microscopy (TEM) analysis of microcraters in contact pad associated particle OREX-452001-0.